根据报告结果,综合老化测试可以呈现和IEC TS 63209-1 B序列相同的测试效果,但时间大幅缩短,这对企业研发和评估新材料会很有帮助。 qualification and type approval - Part 1-3: Special requirements for testing of thin-film amorphous silicon
更多的讨论和研究将在工作组内展开,目前工作组正在召集中,计划最终以类似于IEC TS63126的技术规范的形式发布
降低热斑设备要求
RETC提议将稳态模拟器的光谱匹配度和光强均匀性由现在的B级降到 Design qualification and type approval - Part 1-1: Special requirements for testing of crystalline silicon
Elucidating potential‐induced degradation in bifacial
PERC silicon photovoltaic modules. Elucidating potential‐induced degradation in bifacial PERC silicon photovoltaic modules.
另外,测试相关方面,主要变化为将B序列的UV测试正面、背面按顺序进行更改成为可以在2块组件上分别进行,以减少测试周期。 modules - Test methods for the detection of potential-induced degradation - Part 1-1 Crystalline silicon
b)Solar PV/ Thermal Power Systems, Equipment and Products: grid-connected PV power system, off-grid tabbers/stringers, laminators and other related;
Thin-Film Panel Production Equipment: amorphous silicon
b)Solar PV/ Thermal Power Systems, Equipment and Products: grid-connected PV power system, off-grid tabbers/stringers, laminators and other related;
Thin-Film Panel Production Equipment: amorphous silicon